ATV-SEMAPP inviterer til ‘Surface Characterization Conference’
Den 1. og 2. juni 2022 inviterer ATV-SEMAPP til konferencen ’Surface Characterization Conference’, hvor der bliver rig lejlighed for at få den nyeste viden inden for overfladekarakterisering.
Vær med når ATV-SEMAPP slår dørene op for konferencen ’Surface Characterization Conference’, som er den 3. i rækken.
Konferencen bliver holdt på DTU den 1. & 2. juni 2022, hvor der bliver rig lejlighed for at få den nyeste viden inden for overfladekarakterisering.
ATV-SEMAPP har allieret sig med de førende europæiske industrivirksomheder og forskere, som inden for sessionerne, Elektron & Helium Ion Mikroskopi, Big Science, optiske teknikker, mekaniske teknikker, kemisk analyser og belægninger vil gøre os klogere.
Program:
1. juni
- Synchrotron based microscopy to study the nanometer protective oxide of stainless steel in-situ during heating
v. Axel Knutsson, Senior Materials Specialist, Alfa Laval AB - Non-destructive characterization of mechanical residual stresses in metals
v. Hanna Leemreize, Senior Specialist, Danish Technological Institute - Topic to be announced
v. Carsten Gundlach, Technical University of Denmark - Principles and applications of mechanical surface characterization
v. Per Jageland, Area Sales Manager, Anton Paar Nordic - Automated measurements and smart data processing for atomic force microscopy
v. Martin Pfeiler-Deutschmann, Material characterization expert – AFM, Anton Paar, Austria - Advanced mechanical and surface testing for sustainable materials
v. Rob van Beek, Product Manager, ST Instruments - Clever little SEM
v. Sasha Vuckovic, Senior Specialist AES Sales & Applications, Hitachi High-Tech Europe GmbH - Combining Crossbeam Laser and X-Ray Microscopy: Massive material removal and ultrafast site-specific sample preparation
v. Peter Gnauck, Business Development Manager, Zeiss - Helium Ion Microscopy for surface analysis at sub-nanometer resolution
v. Jacek Fiutowski, Associate Professor, University of Southern Denmark
2. juni
- From conventional SDDs to FlatQUAD – Advanced EDS microanalysis for SEM
v. Michael Abratis, Senior Applications Scientist, Bruker Nano GmbH, Germany - Extending analysis beyond EDS – using WDS and Micro-XRF in SEM
v. Michael Abratis, Senior Applications Scientist, Bruker Nano GmbH, Germany - Advances in microscopic 3D techniques for industrial inspection
v. Roger Artigas, President and CTO at Sensofar Tech SL. - Versatile materials characterization: get more information of your sample with one instrument
v. Torben Wulff, Business Sector Manager, Carl Zeiss Microscopy GmbH, - Digitalize surface appearance
v. Martin Lindbom, Application Engineer, Konica Minolta Sensing Europe B.V. - Advanced techniques for chemical surface analysis
v. Mats Eriksson, General Manager, Hitachi High-Tech Europe GmbH - Modern contact angle analysis to create outstanding surfaces
v. Malte Snoyek, Technical Consultant, Krüss Scientific GmbH - Solving industrial challenges with advanced surface analysis – examples of applicability of XPS
v. Daniel Minzari, Senior Consultant, IPU Denmark