ATV-SEMAPP inviterer til ‘Surface Characterization Conference’

Vær med når ATV-SEMAPP slår dørene op for konferencen ’Surface Characterization Conference’, som er den 3. i rækken.

Konferencen bliver holdt på DTU den 1. & 2. juni 2022, hvor der bliver rig lejlighed for at få den nyeste viden inden for overfladekarakterisering.

ATV-SEMAPP har allieret sig med de førende europæiske industrivirksomheder og forskere, som inden for sessionerne, Elektron & Helium Ion Mikroskopi, Big Science, optiske teknikker, mekaniske teknikker, kemisk analyser og belægninger vil gøre os klogere.

Program:

1. juni 

• Synchrotron based microscopy to study the nanometer protective oxide of stainless steel in-situ during heating 
  v. Axel Knutsson, Senior Materials Specialist, Alfa Laval AB
• Non-destructive characterization of mechanical residual stresses in metals
  v. Hanna Leemreize, Senior Specialist, Danish Technological Institute
• Topic to be announced
  v. Carsten Gundlach, Technical University of Denmark
• Principles and applications of mechanical surface characterization
  v. Per Jageland, Area Sales Manager, Anton Paar Nordic
• Automated measurements and smart data processing for atomic force microscopy
  v. Martin Pfeiler-Deutschmann, Material characterization expert – AFM, Anton Paar, Austria
• Advanced mechanical and surface testing for sustainable materials
  v. Rob van Beek, Product Manager, ST Instruments
• Clever little SEM
  v. Sasha Vuckovic, Senior Specialist AES Sales & Applications, Hitachi High-Tech Europe GmbH
• Combining Crossbeam Laser and X-Ray Microscopy: Massive material removal and ultrafast site-specific sample preparation
  v. Peter Gnauck, Business Development Manager, Zeiss
• Helium Ion Microscopy for surface analysis at sub-nanometer resolution
  v. Jacek Fiutowski, Associate Professor, University of Southern Denmark

2. juni

• From conventional SDDs to FlatQUAD – Advanced EDS microanalysis for SEM
  v. Michael Abratis, Senior Applications Scientist, Bruker Nano GmbH, Germany
• Extending analysis beyond EDS – using WDS and Micro-XRF in SEM
  v. Michael Abratis, Senior Applications Scientist, Bruker Nano GmbH, Germany
• Advances in microscopic 3D techniques for industrial inspection
  v. Roger Artigas, President and CTO at Sensofar Tech SL.
• Versatile materials characterization: get more information of your sample with one instrument
  v. Torben Wulff, Business Sector Manager, Carl Zeiss Microscopy GmbH,
• Digitalize surface appearance
  v. Martin Lindbom, Application Engineer, Konica Minolta Sensing Europe B.V. 
• Advanced techniques for chemical surface analysis
  v. Mats Eriksson, General Manager, Hitachi High-Tech Europe GmbH
• Modern contact angle analysis to create outstanding surfaces
  v. Malte Snoyek, Technical Consultant, Krüss Scientific GmbH
• Solving industrial challenges with advanced surface analysis – examples of applicability of XPS
  v. Daniel Minzari, Senior Consultant, IPU Denmark

Tilmelding

Se det mere detaljerede program og tilmeld dig her.